Preparation and characterization of cadmium telluride (CdTe) thin films via thermal evaporation for capability in optoelectronic applications. After being deposited CdTe on a glass substrate, thin films were electrically and structurally investigated. X-ray diffraction (XRD) confirmed the polycrystalline nature of the films with a preferred orientation along the (111) plane. With characterization of film such as XRD analysis, SEM, etc., the annealing temperature increased, the grain size and crystallinity improved. Hall effect measurements were used to assess electrical characteristics such resistivity, carrier concentration, and mobility. The findings show that optimal thermal evaporation conditions may greatly improve the electrical performance and purity of CdTe films, indicating their potential for effective optical properties.