In this study, cadmium sulphide thick films were grown by screen-printing technique on glass substrate. The thickness of the deposited film was found to be 1 µm and the film was yellow in color. The deposited films were analyzed by X-ray diffraction (XRD), field emission scanning electron microscopy, energy dispersive spectroscopy (EDS), UV-visible spectrophotometer, and DC electrical resistivity measurement were conducted for structural, surface morphological, elemental, optical, and electrical analysis, respectively. According to the XRD patterns, the powder and films have a preferred orientation (111) and (101) respectively, and they are polycrystalline and have a wurtzite structure with a hexagonal phase. The structural parameters viz. inter-planar spacing, crystalline size, lattice constant, internal strain and dislocation density were calculated and found to vary with the nature of the substrates. FE-SEM image indicates that the films were uniform and well covered to the glass substrate also the films are compact, homogeneous and have granular structure without any defects like pin holes and cracks. The EDX analysis verifies that the film contains Cd and S elements in a ratio of 0.83. Absorption spectra of these films were used to determine their energy band gap. It was discovered that the films had a direct band gap transition at 2.33 eV. The dark electrical conductivity and photoconductivity reveals that the films were semiconducting in nature indicating the suitability of these films for photo sensor applications. It was discovered that when the temperature rose, the thick coatings electrical resistance reduced. According to TEP experiments, film has n-type conductivity.