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Article – Journal of Nanoscience and Technology

Journal of Nanoscience and Technology, Volume 11,Issue 2,2026 Pages 1069-1070


Synthesis and X-Ray Diffractogram of Zinc Sulphide Thin Film Prepared by Sol Gel Technique
Bhagyashri Dilip Patil, Suraj Shatrughna Paraskar, Anil Ramdas Bari*

https://doi.org/10.30799/jnst.S108.26110208

This work is licensed under a Creative Commons Attribution 4.0 International License

In the field of materials science, the complex connection between the optical and electrical characteristics of metal chalcogenide materials has made their study attractive. In this paper, at room temperature sol gel technique was used to prepared zinc sulphide thin film using zinc acetate dihydrate, thiourea, absolute ethanol, triethanolamine. Zinc sulphide thin film was prepared manually. The crystal structure of ZnS was found using X-ray diffraction. The diffraction peaks of ZnS were located at 2θ- 28.56°, 33.08°, 47.40°, 56.34°, 69.44° which is compared to standard PDF card- 9000107. And due to this it has been found that zinc sulphide structure was cubic structure.



Keywords: Zinc Sulphide; Sol-Gel Method; Thin Film;

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