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Article – Journal of Advanced Electrochemistry

Journal of Advanced Electrochemistry, Volume 2,Issue 1,2016 Pages 45-49


Influence of Doping Effect on The Infrared Spectra, X-Ray Powder Diffractogram and Thermal Spectra of [0.7(Ag2HgI4):0.3(AgIx:CuI(1-x))] of Fast-Ion Conductors (x = 0.2, 0.4, 0.6 and 0.8 mol. wt. %)
N. Saba*, A. Ahmad

The origin and nature of correlation between silver and copper ion conduction and composition of various phases present in the mixed system [0.7(Ag2HgI4):0.3(AgIx:CuI(1-x))] (where x = 0.2, 0.4, 0.6 and 0.8 mol. wt. %) were prepared by solid state reaction of the appropriate solid mixtures and quenching them at particular temperature. Powdered samples of different compositions containing x mol. wt. % of (AgIx:CuI(1-x)) were synthesized by solid state reactions, using [Ag2HgI4] ternary halides as host. Powder specimens of these compositions were analyzed using Fourier transmission infrared spectra (FTIR), x-ray powder diffraction (XRD) differential thermal analysis (DTA), differential scanning calorimetry (DSC) and thermal gravimetric analysis (TGA) techniques. These studies have confirmed the formation of new products as revealed by the absence of diffraction peaks of parent materials in the XRD patterns. Among the various compositions, a significant number of peaks found to contain Ag+ and Cu+ in Ag2HgI4 respectively and DSC traces have indicated the characteristic melting temperature of [0.7(Ag2HgI4):0.3(AgIx:CuI(1-x))] at around 527.8 K, 516.6 K, 586.82 K and 494.8 K in x = 0.2, 0.4, 0.6 and 0.8 respectively. Fourier transmission infrared spectra of all the the fast ionic conductors [0.7(Ag2HgI4):0.3(AgIx:CuI(1-x))] provided assignment for the more prominent infrared spectra to specific irreducible representation.



Keywords: Thermal Analysis; Doping; FTIR; XRD;